集成电路150kHz-1GHz电磁辐射测量第2部分:辐射发射测量TEM小室和宽带TEM小室法Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method

所属领域：产品质量检验

标准状态：现行有效

入库时间： 2026-05-31 00:00:00

标准编号： IEC61967-2:2005

需要集成电路150kHz-1GHz电磁辐射测量第2部分:辐射发射测量TEM小室和宽带TEM小室法Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method 检测服务？

腾树检测合作实验室具备 CMA/CNAS 双重资质，可依据 IEC61967-2:2005 提供全项检测服务

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标准信息

标准编号

IEC61967-2:2005

标准名称

集成电路150kHz-1GHz电磁辐射测量第2部分:辐射发射测量TEM小室和宽带TEM小室法Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method

所属领域

产品质量检验

当前状态

现行有效

检测服务说明

腾树检测可依据 IEC61967-2:2005《集成电路150kHz-1GHz电磁辐射测量第2部分:辐射发射测量TEM小室和宽带TEM小室法Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method》提供专业的第三方检测服务：

资质保障：合作实验室具备 CMA（检验检测机构资质认定）及 CNAS（中国合格评定国家认可委员会）双重资质
高效周期：常规项目 5-7 个工作日出具报告，加急可缩短至 1-2 个工作日
全国服务：支持快递送样 + 全国上门采样，服务覆盖主要城市
专业支持：工程师一对一服务，提供检测方案制定、样品指导、报告解读等全流程服务
报告权威：检测报告全国通用，国际可通过 ILAC-MRA 框架获得多国认可

集成电路150kHz-1GHz电磁辐射测量第2部分:辐射发射测量TEM小室和宽带TEM小室法Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method

需要 集成电路150kHz-1GHz电磁辐射测量第2部分:辐射发射测量TEM小室和宽带TEM小室法Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method 检测服务？

标准信息

检测服务说明

同领域相关标准

需要集成电路150kHz-1GHz电磁辐射测量第2部分:辐射发射测量TEM小室和宽带TEM小室法Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method 检测服务？