集成电路测试:电磁抗扰度测量-IC带状线法Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
所属领域:产品质量检验
标准状态:现行有效
入库时间:2026-05-31 00:00:00
标准编号:IEC62132-8:2012
需要 集成电路测试:电磁抗扰度测量-IC带状线法Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method 检测服务?
集成电路测试:电磁抗扰度测量-IC带状线法Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
所属领域
产品质量检验
当前状态
现行有效
检测服务说明
腾树检测可依据 IEC62132-8:2012《集成电路测试:电磁抗扰度测量-IC带状线法Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method》提供专业的第三方检测服务: